University of Nebraska Kearney

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UNK Academics
Natural & Social Sciences
Chemistry
 

Scott Darveau

Professor and Chair
Ph.D. University of Chicago, 1998

 

Department of Chemistry
415 Bruner Hall of Science
University of Nebraska at Kearney
Kearney, NE 68849-1150

Office: Bruner Hall of Science 415B
Phone: 308.865.8491
Fax: 308.865.8399
Personal Page

Email:darveausa@unk.edu 

Areas of Interest

Physical Chemistry, Spectroscopy, Thin-Film Materials for Photo-Voltaics, Nanomaterials

Education

Ph.D. Physical Chemistry, University of Chicago, 1998
B.S. Chemistry (with Highest Distinction), University of Nebraska – Lincoln, 1992

Faculty Appointments

2011-present Chair, Department of Chemistry, University of Nebraska at Kearney
2007-present Full Professor, Department of Chemistry, University of Nebraska at Kearney
2003-2007 Associate Professor, Department of Chemistry, University of Nebraska at Kearney
1997-2003 Assistant Professor, Department of Chemistry, University of Nebraska at Kearney

Recent Publications

  1. “Air Stable, Photosensitive, Phase Pure Iron Pyrite Nanocrystal Thin Films for Photovoltaic Application,” Bu, Y.; Yuan, Y.; Exstrom, C.L.; Darveau, S.A.; Huang, J., Nano Letters, 2011, 11, 4953-4957.
  2. “CuIn1-xAlxS2 Thin Films Prepared by Sulfurization of Metallic Precursors,” Olejníček, J.; Slaymaker, L.E.; Darveau, S.A.; Exstrom, C.L.; Kment, Š.; Prabukanthan, P.; Ianno, N.J.; Soukup, R.J. Journal of Alloys and Compounds, 509, 10020-10024, 2011.
  3. “Properties of CuIn1-xGaxSe2 Films Prepared by the Rapid Thermal Annealing of Spray-deposited CuIn1-xGaxS2 and Se,” Slaymaker, L.E.; Hoffman, N.M.; Ingersoll, M.A.; Jensen, M.R.; Olejníček, J.; Exstrom, C.L.; Darveau, S.A.; Soukup, R.J.; Ianno, N.J.; Sarkar, A.; Kment, Š., Materials Research Society Symposium Proceedings, 2011, 1324, DOI: 10.1557/opl.2011.1152
  4. “Formation of CuIn1-xAlxSe2 Thin Films Studied by Raman Scattering”, Olejnek, J.; Kamler, C.A.; Darveau, S.A.; Exstrom, C.L.; Slaymaker, L.E.*; Vandeventer, A.R.*; Ianno, N.J.; Soukup, R.J. Thin Solid Films, 519, 5329-5334 (2011).